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  Measurement of the Interfacial Shear Strength of Thin Copper Films on Sapphire by Microindentation Experiments

Dehm, G., Raj, R., & Rühle, M. (2011). Measurement of the Interfacial Shear Strength of Thin Copper Films on Sapphire by Microindentation Experiments. In Materials Research Symposium Proceedings 1996 (Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II) (pp. 151-156). Boston, MA, USA: Materials Research Society. doi:10.1557/PROC-403-151.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-998F-2 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-9990-F
Genre: Conference Paper

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 Creators:
Dehm, Gerhard1, Author              
Raj, Rishi2, Author              
Rühle, Manfred3, Author              
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Department of Materials Science and Engineering, Cornell University, Bard Hall, Ithaca, NY, 14853-1501, USA, persistent22              
3Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

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Language(s): eng - English
 Dates: 19962011-02-152011
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1557/PROC-403-151
 Degree: -

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Title: 1996 MRS Fall Meeting & Exhibit
Place of Event: Boston, MA, USA
Start-/End Date: 1996-12-02 - 1996-12-06

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Title: Materials Research Symposium Proceedings 1996 (Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II)
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: Boston, MA, USA : Materials Research Society
Pages: - Volume / Issue: 403 Sequence Number: - Start / End Page: 151 - 156 Identifier: -