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  Structure of Copper/Sapphire Interfaces

Dehm, G., Rühle, M., Ding, G., & Raj, R. (1994). Structure of Copper/Sapphire Interfaces. In B. Jouffrey (Ed.), Electron Microscopy 1994: Proceedings of the 13th International Congress on Electron Microscopy, Applications in Materials Sciences (pp. 277-278). Les Editions de Physique; 1994.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-996A-C Version Permalink: http://hdl.handle.net/21.11116/0000-0001-996B-B
Genre: Conference Paper

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 Creators:
Dehm, Gerhard1, Author              
Rühle, Manfred2, Author              
Ding, G.3, Author              
Raj, Rishi3, Author              
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
3Department of Materials Science and Engineering, Cornell University, Bard Hall, Ithaca, NY, 14853-1501, USA, persistent22              

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Language(s): eng - English
 Dates: 1994
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: 13th International Congress on Electron Microscopy
Place of Event: Paris, France
Start-/End Date: 1994-07-17 - 1994-07-22

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Title: Electron Microscopy 1994 : Proceedings of the 13th International Congress on Electron Microscopy, Applications in Materials Sciences
Source Genre: Proceedings
 Creator(s):
Jouffrey, B.1, Editor
Colliex, C., Author
Affiliations:
1 Editions Physique, Avenue du Hoggar, Zone Industrielle Courtaboeuf, BP112 91944 Les Ulis, France, ou_persistent22            
Publ. Info: Les Editions de Physique; 1994
Pages: - Volume / Issue: 2A-2B Sequence Number: - Start / End Page: 277 - 278 Identifier: -