Windisch, T., Carralero, D., Estrada, T., Grulke, O., Hirsch, M., Kasparek, W., et al. (2018). Reflectometry diagnostics at Wendelstein 7-X: Systems overview and initial results. Poster presented at 22nd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2018), San Diego, CA.