Atomistic Simulations of Surface Effects Under High Electric Fields

Parviainen, Stefan; Dagan, Michal; Katnagallu, Shyam; Gault, Baptiste; Moody, Michael P.; Vurpillot, François

doi:10.1017/S1431927617003889

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Atomistic Simulations of Surface Effects Under High Electric Fields

Parviainen, S., Dagan, M., Katnagallu, S., Gault, B., Moody, M. P., & Vurpillot, F. (2017). Atomistic Simulations of Surface Effects Under High Electric Fields. In Proceedings of Microscopy & Microanalysis 2017 (pp. 644-645). doi:10.1017/S1431927617003889.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-4AA7-0 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-4AAD-A

Genre: Conference Paper

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Creators:
Parviainen, Stefan¹, Author
Dagan, Michal², Author
Katnagallu, Shyam³, Author
Gault, Baptiste³, Author
Moody, Michael P.⁴, Author
Vurpillot, François⁵, Author

Affiliations:
1GPM UMR CNRS 6634, Université de Rouen, Saint-Etienne du Rouvray, France, persistent22
2Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH UK, persistent22
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
4Department of Materials, University of Oxford, Parks Road, Oxford OX13PH, UK, ou_persistent22
5GPM UMR 6634 CNRS, Université et INSA de Rouen, Rouen, France, persistent22

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Language(s): eng - English

Dates: Published Online: 2017-08-04Date issued: 2017

Publication Status: Issued

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Identifiers: DOI: 10.1017/S1431927617003889

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Title: Microscopy & Microanalysis 2017

Place of Event: St. Louis, Missouri, USA

Start-/End Date: 2017-08-06 - 2017-08-10

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Title: Proceedings of Microscopy & Microanalysis 2017

Source Genre: Proceedings

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Pages: - Volume / Issue: 23 (S1) Sequence Number: - Start / End Page: 644 - 645 Identifier: -