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  Atomistic Simulations of Surface Effects Under High Electric Fields

Parviainen, S., Dagan, M., Katnagallu, S., Gault, B., Moody, M. P., & Vurpillot, F. (2017). Atomistic Simulations of Surface Effects Under High Electric Fields. In Proceedings of Microscopy & Microanalysis 2017 (pp. 644-645). doi:10.1017/S1431927617003889.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-4AA7-0 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-4AAD-A
Genre: Conference Paper

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 Creators:
Parviainen, Stefan1, Author              
Dagan, Michal2, Author              
Katnagallu, Shyam3, Author              
Gault, Baptiste3, Author              
Moody, Michael P.4, Author              
Vurpillot, François5, Author              
Affiliations:
1GPM UMR CNRS 6634, Université de Rouen, Saint-Etienne du Rouvray, France, persistent22              
2Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH UK, persistent22              
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
4Department of Materials, University of Oxford, Parks Road, Oxford OX13PH, UK, ou_persistent22              
5GPM UMR 6634 CNRS, Université et INSA de Rouen, Rouen, France, persistent22              

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Language(s): eng - English
 Dates: 2017-08-042017
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1017/S1431927617003889
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Title: Microscopy & Microanalysis 2017
Place of Event: St. Louis, Missouri, USA
Start-/End Date: 2017-08-06 - 2017-08-10

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Title: Proceedings of Microscopy & Microanalysis 2017
Source Genre: Proceedings
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Publ. Info: -
Pages: - Volume / Issue: 23 (S1) Sequence Number: - Start / End Page: 644 - 645 Identifier: -