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  Strong modification of thin film properties due to screening across the interface

Altendorf, S. G., Reisner, A., Tam, B., Meneghin, F., Wirth, S., & Tjeng, L. H. (2018). Strong modification of thin film properties due to screening across the interface. Physical Review B, 97(16): 165422, pp. 1-5. doi:10.1103/PhysRevB.97.165422.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-3D28-F Version Permalink: http://hdl.handle.net/21.11116/0000-0001-3D84-6
Genre: Journal Article

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 Creators:
Altendorf, S. G.1, Author              
Reisner, A.2, Author              
Tam, B.2, Author              
Meneghin, F.2, Author              
Wirth, S.3, Author              
Tjeng, L. H.4, Author              
Affiliations:
1Simone Altendorf, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863458              
2Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863445              
3Steffen Wirth, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863460              
4Liu Hao Tjeng, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863452              

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Language(s): eng - English
 Dates: 2018-04-172018-04-17
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Degree: -

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Title: Physical Review B
  Abbreviation : Phys. Rev. B
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Woodbury, NY : American Physical Society
Pages: - Volume / Issue: 97 (16) Sequence Number: 165422 Start / End Page: 1 - 5 Identifier: ISSN: 1098-0121
CoNE: /journals/resource/954925225008