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  Investigation of the fatigue behavior of Al thin films with different microstructure

Heinz, W., Pippan, R., & Dehm, G. (2010). Investigation of the fatigue behavior of Al thin films with different microstructure. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing, 527(29-30), 7757-7763. doi:10.1016/j.msea.2010.08.046.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-9220-5 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-9221-4
Genre: Journal Article

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 Creators:
Heinz, Walther1, Author              
Pippan, Reinhard1, Author              
Dehm, Gerhard1, 2, Author              
Affiliations:
1Erich Schmid Institute of Material Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
2Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              

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Language(s): eng - English
 Dates: 2010-11-15
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1016/j.msea.2010.08.046
 Degree: -

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Title: Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing
  Abbreviation : Mater. Sci. Eng. A: Struct. Mater. Prop. Microstruct. Process.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 527 (29-30) Sequence Number: - Start / End Page: 7757 - 7763 Identifier: ISSN: 0921-5093
CoNE: /journals/resource/954928498465_1