High-Temperature-Phase Bi4RhI2: Electronic Localization by Structural Distortion

Rasche, Bertold; Ruck, Michael

doi:10.1021/acs.inorgchem.8b00464

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High-Temperature-Phase Bi₄RhI₂: Electronic Localization by Structural Distortion

Rasche, B., & Ruck, M. (2018). High-Temperature-Phase Bi₄RhI₂: Electronic Localization by Structural Distortion. Inorganic Chemistry, 57(9), 5507-5513. doi:10.1021/acs.inorgchem.8b00464.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-647D-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-6481-C

Genre: Journal Article

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Creators:
Rasche, Bertold¹, Author
Ruck, Michael², Author

Affiliations:
1External Organizations, ou_persistent22
2Michael Ruck, Max Planck Fellow, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863444

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Language(s): eng - English

Dates: Published Online: 2018-04-09Date issued: 2018-04-09

Publication Status: Issued

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Identifiers: ISI: 000431833500082
DOI: 10.1021/acs.inorgchem.8b00464

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Title: Inorganic Chemistry

Abbreviation : Inorg. Chem.

Source Genre: Journal

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Publ. Info: Washington, DC : American Chemical Society

Pages: - Volume / Issue: 57 (9) Sequence Number: - Start / End Page: 5507 - 5513 Identifier: ISSN: 0020-1669
CoNE: https://pure.mpg.de/cone/journals/resource/0020-1669