Angle-dependent sputter-yield measurements of keV D ions on Fe and W with a new 
high-current ion source

Arredondo, R.; Oberkofler, M.; Schwarz-Selinger, T.

Local TagsRelease HistoryDetailsSummary

Angle-dependent sputter-yield measurements of keV D ions on Fe and W with a new high-current ion source

Arredondo, R., Oberkofler, M., & Schwarz-Selinger, T. (2018). Angle-dependent sputter-yield measurements of keV D ions on Fe and W with a new high-current ion source. Poster presented at 23rd International Conference on Plasma Surface Interactions in Controlled Fusion Devices (PSI 23), Princeton, NJ.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/21.11116/0000-0001-7001-F Version Permalink: https://hdl.handle.net/21.11116/0000-0010-1B4F-9

Genre: Poster

Files

show Files

Locators

show

Creators

show

hide

Creators:
Arredondo, R.^{1, 2}, Author
Oberkofler, M.¹, Author
Schwarz-Selinger, T.¹, Author

Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327
2External Organizations, ou_persistent22

Content

show

Details

show

hide

Language(s): eng - English

Dates: Submitted: 2017

Publication Status: Submitted

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: -

Event

show

hide

Title: 23rd International Conference on Plasma Surface Interactions in Controlled Fusion Devices (PSI 23)

Place of Event: Princeton, NJ

Start-/End Date: 2018-06-17 - 2018-06-22

Legal Case

show

Project information

show

Source

show