Scanning electron microscopy capabilities for sequential testing and analyses 
of full-size PFC components of AUG

Balden, M.; Elgeti, S.; Neu, R.; Greuner, H.; Herrmann, A.; Krieger, K.; Rohde, V.; Zammuto, I.; ASDEX Upgrade Team, Max Planck Institute for Plasma Physics, Max Planck Society

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Scanning electron microscopy capabilities for sequential testing and analyses of full-size PFC components of AUG

Balden, M., Elgeti, S., Neu, R., Greuner, H., Herrmann, A., Krieger, K., et al. (2018). Scanning electron microscopy capabilities for sequential testing and analyses of full-size PFC components of AUG. Poster presented at 23rd International Conference on Plasma Surface Interactions in Controlled Fusion Devices (PSI 23), Princeton, NJ.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0001-7003-D Versions-Permalink: https://hdl.handle.net/21.11116/0000-0001-7004-C

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Urheber:
Balden, M.¹, Autor
Elgeti, S.¹, Autor
Neu, R.^{1, 2}, Autor
Greuner, H.¹, Autor
Herrmann, A.³, Autor
Krieger, K.¹, Autor
Rohde, V.¹, Autor
Zammuto, I.³, Autor
ASDEX Upgrade Team, Max Planck Institute for Plasma Physics, Max Planck Society, Autor

Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327
2External Organizations, ou_persistent22
3Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856321