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  Scanning electron microscopy capabilities for sequential testing and analyses of full-size PFC components of AUG

Balden, M., Elgeti, S., Neu, R., Greuner, H., Herrmann, A., Krieger, K., et al. (2018). Scanning electron microscopy capabilities for sequential testing and analyses of full-size PFC components of AUG. Poster presented at 23rd International Conference on Plasma Surface Interactions in Controlled Fusion Devices (PSI 23), Princeton, NJ.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-7003-D Version Permalink: https://hdl.handle.net/21.11116/0000-0010-1F47-D
Genre: Poster

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 Creators:
Balden, M.1, Author                 
Elgeti, S.1, Author           
Neu, R.1, 2, Author           
Greuner, H.1, Author           
Herrmann, A.3, Author           
Krieger, K.1, Author           
Rohde, V.1, Author           
Zammuto, I.3, Author           
ASDEX Upgrade Team, Max Planck Institute for Plasma Physics, Max Planck Society, Author              
Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              
2External Organizations, ou_persistent22              
3Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856321              

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Language(s): eng - English
 Dates: 2017
 Publication Status: Submitted
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: 23rd International Conference on Plasma Surface Interactions in Controlled Fusion Devices (PSI 23)
Place of Event: Princeton, NJ
Start-/End Date: 2018-06-17 - 2018-06-22

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