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  Comparison of the quantitative analysis performance between pulsed voltage atom probe and pulsed laser atom probe

Takahashi, J., Kawakami, K., & Raabe, D. (2017). Comparison of the quantitative analysis performance between pulsed voltage atom probe and pulsed laser atom probe. Ultramicroscopy, 175, 105-110. doi:10.1016/j.ultramic.2017.01.015.

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 Creators:
Takahashi, Jun1, Author           
Kawakami, Kazuto2, Author           
Raabe, Dierk3, Author           
Affiliations:
1Advanced Technology Research Labs, Nippon Steel Corporation, Japan, ou_persistent22              
2Nippon Steel & Sumitomo Met Corp, Futtsu, Chiba 2938511, Japan, ou_persistent22              
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Free keywords: FIELD-ION EMITTER; NUMERICAL-CALCULATION; TOMOGRAPHY; TEMPERATURE; EVAPORATION; OPTIMIZATION; IRRADIATION; MICROSCOPY; EVOLUTION; DETECTORMicroscopy; Atom probe; Quantitative analysis; Field evaporation; Preferential evaporation; Copper;
 Abstract: The difference in quantitative analysis performance between the voltage-mode and laser-mode of a local electrode atom probe (LEAP3000X HR) was investigated using a Fe-Cu binary model alloy. Solute copper atoms in ferritic iron preferentially field evaporate because of their significantly lower evaporation field than the matrix iron, and thus, the apparent concentration of solute copper tends to be lower than the actual concentration. However, in voltage-mode, the apparent concentration was higher than the actual concentration at 40K or less due to a detection loss of matrix iron, and the concentration decreased with increasing specimen temperature due to the preferential evaporation of solute copper. On the other hand, in laser-mode, the apparent concentration never exceeded the actual concentration, even at lower temperatures (20K), and this mode showed better quantitative performance over a wide range of specimen temperatures. These results indicate that the pulsed laser atom probe prevents both detection loss and preferential evaporation under a wide range of measurement conditions. (C) 2017 Elsevier B.V. All rights reserved.

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Language(s): eng - English
 Dates: 2017-04-01
 Publication Status: Issued
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Degree: -

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Title: Ultramicroscopy
  Abbreviation : Ultramicroscopy
Source Genre: Journal
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Publ. Info: Amsterdam : North-Holland
Pages: - Volume / Issue: 175 Sequence Number: - Start / End Page: 105 - 110 Identifier: ISSN: 0304-3991
CoNE: https://pure.mpg.de/cone/journals/resource/954925512451