English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  In Situ μLaue: Instrumental Setup for the Deformation of Micron Sized Samples

Kirchlechner, C., Kečkéš, J., Micha, J.-S., & Dehm, G. (2017). In Situ μLaue: Instrumental Setup for the Deformation of Micron Sized Samples. In P. Staron, A. Schreyer, H. Clemens, & S. Mayer (Eds.), Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications: Second Edition (pp. 425-438). Hoboken, NJ, USA: wiley.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/21.11116/0000-0001-711D-0 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-711E-F
Genre: Book Chapter

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Kirchlechner, Christoph1, Author              
Kečkéš, Jozef2, Author              
Micha, Jean-Sebastien3, Author              
Dehm, Gerhard4, Author              
Affiliations:
1Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              
2Department of Materials Physics, Montanuniversität Leoben, Leoben, Austria, ou_persistent22              
3CEA-Grenoble, Institut Nanosciences et Cryogénie, Grenoble, France, ou_persistent22              
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

Content

show
hide
Free keywords: -
 Abstract: Uchic and co-workers were the first ones who performed uniaxial compression tests on micron-sized samples and inspired scientists worldwide to perform similar microcompression, tension, or bending experiments. The straining device is able to perform compression, tensile, or bending experiments. Complementary fine energy scans can be performed by inserting a tunable monochro-mator or a multi-colored rainbow filter in the white beam path in order to determine the energy of selected reflections and to further analyze the full strain tensor. For Laue diffraction experiments, a white X-ray beam consisting of a broad energy band pass is used. Nevertheless, scanning electron microscopy (SEM) just probes the sample surface and, therefore, is only able to monitor glide steps formed by dislocations escaping at the sample surface. These glide steps imply that the activation of discrete dislocation sources are responsible for the plastic deformation of metallic structures. © 2017 Wiley-VCH Verlag GmbH Co. KGaA.

Details

show
hide
Language(s): eng - English
 Dates: 2017-01-27
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: ISBN: 9783527684489; 9783527335923
DOI: 10.1002/9783527684489.ch23
BibTex Citekey: Kirchlechner2017425
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications: Second Edition
Source Genre: Book
 Creator(s):
Staron, Peter1, Editor            
Schreyer, Andreas2, Editor            
Clemens, Helmut3, Editor            
Mayer, Svea4, Editor            
Affiliations:
1 Helmholtz-Zentrum Geesthacht, Institute of Materials Science, Max-Planck-Str. 1, Geesthacht, Germany, persistent22            
2 European Spallation Source ESS ERIC, P.O. Box 176, Lund, Sweden, persistent22            
3 Department of Physical Metallurgy and Materials Testing, Montanuniversität Leoben, 8700 Leoben, Austria, persistent22            
4 Department of Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef Strasse 18, 8700 Leoben, Austria, ou_persistent22            
Publ. Info: Hoboken, NJ, USA : wiley
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 425 - 438 Identifier: -