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  Hole trap formation in polymer light-emitting diodes under current stress

Niu, Q., Rohloff, R., Wetzelaer, G.-J.-A.-H., Blom, P. W. M., & Craciun, N. I. (2018). Hole trap formation in polymer light-emitting diodes under current stress. Nature Materials, 17(6), 557-562. doi:10.1038/s41563-018-0057-x.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-736E-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-736F-2
Genre: Journal Article

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 Creators:
Niu, Quan1, Author              
Rohloff, Roland1, Author              
Wetzelaer, Gert-Jan A. H.1, Author              
Blom, Paul W. M.1, Author              
Craciun, N. Irina1, Author              
Affiliations:
1Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society, ou_1800284              

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Language(s): eng - English
 Dates: 2018
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1038/s41563-018-0057-x
 Degree: -

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Title: Nature Materials
  Abbreviation : Nat. Mater.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: London, UK : Nature Pub. Group
Pages: - Volume / Issue: 17 (6) Sequence Number: - Start / End Page: 557 - 562 Identifier: ISSN: 1476-1122
CoNE: https://pure.mpg.de/cone/journals/resource/111054835734000