Hole trap formation in polymer light-emitting diodes under current stress

Niu, Quan; Rohloff, Roland; Wetzelaer, Gert-Jan A. H.; Blom, Paul W. M.; Craciun, N. Irina

doi:10.1038/s41563-018-0057-x

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Hole trap formation in polymer light-emitting diodes under current stress

Niu, Q., Rohloff, R., Wetzelaer, G.-J.-A.-H., Blom, P. W. M., & Craciun, N. I. (2018). Hole trap formation in polymer light-emitting diodes under current stress. Nature Materials, 17(6), 557-562. doi:10.1038/s41563-018-0057-x.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-736E-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-736F-2

Genre: Journal Article

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Creators:
Niu, Quan¹, Author
Rohloff, Roland¹, Author
Wetzelaer, Gert-Jan A. H.¹, Author
Blom, Paul W. M.¹, Author
Craciun, N. Irina¹, Author

Affiliations:
1Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society, ou_1800284

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Language(s): eng - English

Dates: Date issued: 2018

Publication Status: Issued

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Identifiers: DOI: 10.1038/s41563-018-0057-x

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Title: Nature Materials

Abbreviation : Nat. Mater.

Source Genre: Journal

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Publ. Info: London, UK : Nature Pub. Group

Pages: - Volume / Issue: 17 (6) Sequence Number: - Start / End Page: 557 - 562 Identifier: ISSN: 1476-1122
CoNE: https://pure.mpg.de/cone/journals/resource/111054835734000