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  In-situ TEM straining experiments of Al films on polyimide using a novel FIB design for specimen preparation

Dehm, G., Legros, M., & Heiland, B. (2006). In-situ TEM straining experiments of Al films on polyimide using a novel FIB design for specimen preparation. Journal of Materials Science, 41(14), 4484-4489.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-9806-D Version Permalink: http://hdl.handle.net/21.11116/0000-0001-9807-C
Genre: Conference Paper

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 Creators:
Dehm, Gerhard1, 2, Author              
Legros, Marc3, Author              
Heiland, Birgit4, Author              
Affiliations:
1Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              
2Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
3CEMES-CNRS, 29 rue J. Marvig, 31055 Toulouse, France, ou_persistent22              
4Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
 Abstract: -

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Language(s): eng - English
 Dates: 2006-07
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: eDoc: 297819
ISI: 000239720900014
DOI: 10.1007/s10853-006-0087-7
 Degree: -

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Title: 10th Meeting on Frontiers of Electron Microscopy in Materials Science
Place of Event: Maastricht, The Netherlands
Start-/End Date: 2005-09-25 - 2005-09-30

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Title: Journal of Materials Science
  Abbreviation : JMS
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: New York, NY, USA : Springer
Pages: - Volume / Issue: 41 (14) Sequence Number: - Start / End Page: 4484 - 4489 Identifier: ISSN: 0022-2461
CoNE: https://pure.mpg.de/cone/journals/resource/954925415936_1