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  Thermal stability of Ti and Pt nanowires manufactured by Ga+ focused ion beam

Inkson, B. J., Dehm, G., & Wagner, T. A. (2004). Thermal stability of Ti and Pt nanowires manufactured by Ga+ focused ion beam. Journal of Microscopy, 214(3), 252-260. doi:10.1111/j.0022-2720.2004.01344.x.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-97FC-9 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-97FD-8
Genre: Journal Article

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 Creators:
Inkson, Beverley J.1, Author              
Dehm, Gerhard2, Author              
Wagner, Thomas A.3, Author              
Affiliations:
1Department of Engineering Materials, University of Sheffield, Mappin Street, Sheffield S1 3JD, United Kingdom, ou_persistent22              
2Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
3Ehem. Max-Planck-Institut für Metallforschung, Stuttgart, Germany, ou_persistent:13              

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Free keywords: MPI für Metallforschung; Abt. Arzt; ZWE Dünnschichtlabor;
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Language(s): eng - English
 Dates: 2004
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: eDoc: 175366
DOI: 10.1111/j.0022-2720.2004.01344.x
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Title: Journal of Microscopy
Source Genre: Journal
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Publ. Info: Oxford : Blackwell Science
Pages: - Volume / Issue: 214 (3) Sequence Number: - Start / End Page: 252 - 260 Identifier: ISSN: 0022-2720
CoNE: https://pure.mpg.de/cone/journals/resource/954927663105_2