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  Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling

Volkert, C. A., Busch, S., Heiland, B., & Dehm, G. (2004). Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling. Journal of Microscopy, 214(3), 208-212. doi:10.1111/j.0022-2720.2004.01352.x.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-97FA-B Version Permalink: http://hdl.handle.net/21.11116/0000-0001-97FB-A
Genre: Journal Article

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 Creators:
Volkert, Cynthia A.1, 2, Author              
Busch, Susanne3, Author              
Heiland, Birgit1, Author              
Dehm, Gerhard1, Author              
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Institut für Materialforschung II, Forschungszentrum Karlsruhe, 76021 Karlsruhe, Germany, persistent22              
3Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404              

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Free keywords: apatite; FIB; focused ion beam milling; TEM sample preparation; tooth enamel; ultramicrotomy
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Language(s): eng - English
 Dates: 2004-06
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 220192
ISI: 000221536000002
DOI: 10.1111/j.0022-2720.2004.01352.x
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Title: Journal of Microscopy
Source Genre: Journal
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Publ. Info: Oxford : Blackwell Science
Pages: - Volume / Issue: 214 (3) Sequence Number: - Start / End Page: 208 - 212 Identifier: ISSN: 0022-2720
CoNE: https://pure.mpg.de/cone/journals/resource/954927663105_2