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  Channel cracking of β-NiAl thin films on Si substrates

Wellner, P., Kraft, O., Dehm, G., Andersons, J., & Arzt, E. (2004). Channel cracking of β-NiAl thin films on Si substrates. Acta Materialia, 52(8), 2325-2336. doi:10.1016/j.actamat.2004.01.023.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-97F2-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-97F3-2
Genre: Journal Article

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 Creators:
Wellner, Patrick1, Author              
Kraft, Oliver2, Author              
Dehm, Gerhard1, Author              
Andersons, J.3, Author              
Arzt, Eduard1, Author              
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Karlsruhe Institute of Technology, Institute for Applied Materials, Engelbert-Arnold-Strasse 4, Karlsruhe, Germany, ou_persistent22              
3Institute of Polymer Mechanics, Riga, Latvia, persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
 Abstract: -

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Language(s): eng - English
 Dates: 2004-05-03
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: eDoc: 175371
DOI: 10.1016/j.actamat.2004.01.023
 Degree: -

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Title: Acta Materialia
  Abbreviation : Acta Mater.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Kidlington : Elsevier Science
Pages: - Volume / Issue: 52 (8) Sequence Number: - Start / End Page: 2325 - 2336 Identifier: ISSN: 1359-6454
CoNE: /journals/resource/954928603100