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  Dynamic observation of Al thin films plastically strained in a TEM

Legros, M., Dehm, G., Keller-Flaig, R.-M., Arzt, E., Hemker, K. J., & Süresh, S. (2001). Dynamic observation of Al thin films plastically strained in a TEM. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing, 309-310, 463-467. doi:10.1016/S0921-5093(00)01702-0.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-9698-A Version Permalink: http://hdl.handle.net/21.11116/0000-0001-9699-9
Genre: Journal Article

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 Creators:
Legros, Marc1, 2, Author              
Dehm, Gerhard3, Author              
Keller-Flaig, Rose-Marie3, Author              
Arzt, Eduard3, Author              
Hemker, Kevin Jude2, Author              
Süresh, Subra4, Author              
Affiliations:
1CEMES-CNRS, 29 rue J. Marvig, 31055 Toulouse, France, ou_persistent22              
2Department of Mechanical Engineering, Johns Hopkins University, Baltimore, MD 21218, USA, persistent22              
3Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
4Department of Mechanical Engineering, Dept. of Mat. Sci. and Engineering, MIT, Cambridge, MA 02139, USA, persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt; thin film; in situ; Al; cross-section; dislocations; interface
 Abstract: -

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Language(s): eng - English
 Dates: 2001-07-15
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: eDoc: 21075
ISI: 000169044600092
DOI: 10.1016/S0921-5093(00)01702-0
 Degree: -

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Title: Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing
  Abbreviation : Mater. Sci. Eng. A: Struct. Mater. Prop. Microstruct. Process.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: New York, NY : Elsevier
Pages: - Volume / Issue: 309-310 Sequence Number: - Start / End Page: 463 - 467 Identifier: ISSN: 0921-5093
CoNE: /journals/resource/954928498465_1