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  In-situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate

Dehm, G., & Arzt, E. (2000). In-situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate. Applied Physics Letters, 77(8), 1126-1128. doi:10.1063/1.1289488.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-966E-B Version Permalink: http://hdl.handle.net/21.11116/0000-0001-966F-A
Genre: Journal Article

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 Creators:
Dehm, Gerhard1, Author              
Arzt, Eduard1, Author              
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
 Abstract: -

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Language(s): eng - English
 Dates: 2000-08-21
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: eDoc: 43723
DOI: 10.1063/1.1289488
 Degree: -

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Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: 77 (8) Sequence Number: - Start / End Page: 1126 - 1128 Identifier: Other: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223