English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces

Dehm, G., Raj, R., & Rühle, M. (1996). Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces. Materials Science Forum, 207-209(2), 597-600. doi:10.4028/www.scientific.net/MSF.207-209.597.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/21.11116/0000-0001-9560-A Version Permalink: http://hdl.handle.net/21.11116/0000-0001-9561-9
Genre: Journal Article

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Dehm, Gerhard1, Author              
Raj, Rishi2, Author              
Rühle, Manfred3, Author              
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Department of Materials Science and Engineering, Cornell University, Bard Hall, Ithaca, NY, 14853-1501, USA, persistent22              
3Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 1996
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Materials Science Forum
  Abbreviation : Mater. Sci. Forum
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 207-209 (2) Sequence Number: - Start / End Page: 597 - 600 Identifier: ISSN: 0255-5476
CoNE: https://pure.mpg.de/cone/journals/resource/954928550320