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  Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al2O3

Dehm, G., Scheu, C., Raj, R., & Rühle, M. (1996). Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al2O3. Materials Science Forum, 207-209(1), 217-220. doi:10.4028/www.scientific.net/MSF.207-209.217.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-9538-8 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-9543-B
Genre: Journal Article

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 Creators:
Dehm, Gerhard1, Author              
Scheu, Christina2, Author              
Raj, Rishi3, Author              
Rühle, Manfred2, Author              
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
3Department of Materials Science and Engineering, Cornell University, Bard Hall, Ithaca, NY, 14853-1501, USA, persistent22              

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Language(s): eng - English
 Dates: 1996-02
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Degree: -

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Title: Materials Science Forum
  Abbreviation : Mater. Sci. Forum
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 207-209 (1) Sequence Number: - Start / End Page: 217 - 220 Identifier: ISSN: 0255-5476
CoNE: https://pure.mpg.de/cone/journals/resource/954928550320