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  Electron Energy-Loss Spectroscopy at Cu/Al2O3 and Ti/Al2O3 Interfaces

Scheu, C., Dehm, G., Müllejans, H., & Rühle, M. (1996). Electron Energy-Loss Spectroscopy at Cu/Al2O3 and Ti/Al2O3 Interfaces. Materials Science Forum, 207-209(1), 181-184. doi:10.4028/www.scientific.net/MSF.207-209.181.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-9530-0 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-9532-E
Genre: Journal Article

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 Creators:
Scheu, Christina1, Author              
Dehm, Gerhard2, Author              
Müllejans, Harald1, Author              
Rühle, Manfred1, Author              
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

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Language(s): eng - English
 Dates: 1996
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: -
 Degree: -

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Title: Materials Science Forum
  Abbreviation : Mater. Sci. Forum
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 207-209 (1) Sequence Number: - Start / End Page: 181 - 184 Identifier: ISSN: 0255-5476
CoNE: https://pure.mpg.de/cone/journals/resource/954928550320