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  Quantification of Irradiation Damage Generated During HRTEM with 1250keV Electrons

Dehm, G., Nadarzinski, K., Ernst, F., & Rühle, M. (1996). Quantification of Irradiation Damage Generated During HRTEM with 1250keV Electrons. Ultramicroscopy, 63(1), 49-55. doi:10.1016/0304-3991(96)00025-3.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-952E-4 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-952F-3
Genre: Journal Article

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 Creators:
Dehm, Gerhard1, Author              
Nadarzinski, K.2, Author              
Ernst, Frank3, Author              
Rühle, Manfred3, Author              
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Max-Planck-Inst. fur Metallforschung, Inst. für Werkstoffwissenschaft, Seestrasse 92, D-70174 Stuttgart, Germany, persistent22              
3Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

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Language(s): eng - English
 Dates: 1996-04
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/0304-3991(96)00025-3
 Degree: -

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Title: Ultramicroscopy
  Abbreviation : Ultramicroscopy
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 63 (1) Sequence Number: - Start / End Page: 49 - 55 Identifier: ISSN: 0304-3991
CoNE: https://pure.mpg.de/cone/journals/resource/954925512451