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  Stability optimized, 4-mJ and 1.2-ps pulses from a Ho:YLF regenerative amplifier

Krötz, P., Chatterjee, G., Ruehl, A., Murari, K., Kärtner, F. X., Hartl, I., et al. (2016). Stability optimized, 4-mJ and 1.2-ps pulses from a Ho:YLF regenerative amplifier. In 2016 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO). NEW YORK, NY 10017 USA: IEEE.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-8F21-9 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-99D8-F
Genre: Conference Paper

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07788494.pdf (Publisher version), 139KB
 
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2016
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https://ieeexplore.ieee.org/document/7788494/ (Publisher version)
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 Creators:
Krötz, P.1, 2, Author           
Chatterjee, G.1, 2, Author           
Ruehl, A.3, Author
Murari, K.2, 3, 4, Author
Kärtner, F. X.2, 3, 4, 5, Author
Hartl, I.3, Author
Miller, R. J. D.1, 2, 5, 6, Author           
Affiliations:
1Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_1938288              
2Center for Free-Electron Laser Science (CFEL), ou_persistent22              
3Deutsches Elektronen-Synchrotron (DESY), ou_persistent22              
4Department of Physics, University of Hamburg, ou_persistent22              
5Centre for Ultrafast Imaging (CUI), Universität Hamburg, ou_persistent22              
6Departments of Chemistry and Physics, University of Toronto, ou_persistent22              

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 Abstract: Optimization of gain depletion in Ho:YLF regenerative amplifiers resulted in highly stable pulses with fluctuations of 0.35%. Integration of an intra-cavity-etalon decreased the pulse duration to 1.2 ps, while having pulse energies of 4 mJ.

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Language(s): eng - English
 Dates: 2016-12-192016-12-19
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Internal
 Identifiers: Other: INSPEC Accession Number: 16553418
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Title: Conference on Lasers and Electro-Optics (CLEO) 2016
Place of Event: San Jose, CA
Start-/End Date: 2016-06-05 - 2016-06-10

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Title: 2016 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)
Source Genre: Proceedings
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Publ. Info: NEW YORK, NY 10017 USA : IEEE
Pages: - Volume / Issue: - Sequence Number: INSPEC Accession Number: 16553418 Start / End Page: - Identifier: ISBN: 978-1-943580-11-8

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Title: Conference on Lasers and Electro-Optics
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Publ. Info: NEW YORK, NY 10017 USA : IEEE
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