Know your full potential: Quantitative Kelvin probe force microscopy on 
nanoscale electrical devices

Axt, Amelie; Hermes, Ilka M.; Bergmann, Victor W.; Tausendpfund, N.; Weber, Stefan A. L.

doi:10.3762/bjnano.9.172

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Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

Axt, A., Hermes, I. M., Bergmann, V. W., Tausendpfund, N., & Weber, S. A. L. (2018). Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices. Beilstein Journal of Nanotechnology, 9, 1809-1819. doi:10.3762/bjnano.9.172.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-A977-B Version Permalink: https://hdl.handle.net/21.11116/0000-0001-A978-A

Genre: Journal Article

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Creators:
Axt, Amelie¹, Author
Hermes, Ilka M.¹, Author
Bergmann, Victor W.¹, Author
Tausendpfund, N., Author
Weber, Stefan A. L.¹, Author

Affiliations:
1Dept. Butt: Physics at Interfaces, MPI for Polymer Research, Max Planck Society, ou_1800286

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Language(s): eng - English

Dates: Date issued: 2018

Publication Status: Issued

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Identifiers: DOI: 10.3762/bjnano.9.172

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Title: Beilstein Journal of Nanotechnology

Source Genre: Journal

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Publ. Info: Frankfurt am Main : Beilstein-Institut

Pages: - Volume / Issue: 9 Sequence Number: - Start / End Page: 1809 - 1819 Identifier: ISSN: 2190-4286
CoNE: https://pure.mpg.de/cone/journals/resource/2190-4286