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  Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

Axt, A., Hermes, I. M., Bergmann, V. W., Tausendpfund, N., & Weber, S. A. L. (2018). Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices. Beilstein Journal of Nanotechnology, 9, 1809-1819. doi:10.3762/bjnano.9.172.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-A977-B Version Permalink: http://hdl.handle.net/21.11116/0000-0001-A978-A
Genre: Journal Article

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 Creators:
Axt, Amelie1, Author              
Hermes, Ilka M.1, Author              
Bergmann, Victor W.1, Author              
Tausendpfund, N., Author
Weber, Stefan A. L.1, Author              
Affiliations:
1Dept. Butt: Physics at Interfaces, MPI for Polymer Research, Max Planck Society, ou_1800286              

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Language(s): eng - English
 Dates: 2018
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.3762/bjnano.9.172
 Degree: -

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Title: Beilstein Journal of Nanotechnology
Source Genre: Journal
 Creator(s):
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Publ. Info: Frankfurt am Main : Beilstein-Institut
Pages: - Volume / Issue: 9 Sequence Number: - Start / End Page: 1809 - 1819 Identifier: ISSN: 2190-4286
CoNE: https://pure.mpg.de/cone/journals/resource/2190-4286