English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Non-destructive in situ analysis of interface processes and thin film growth

Buck, M., Dressler, C., Grunze, M., & Träger, F. (1996). Non-destructive in situ analysis of interface processes and thin film growth. Journal of Adhesion, 58(3-4), 227-241. doi:10.1080/00218469608015202.

Item is

Files

show Files
hide Files
:
JAdhesion_58_1996_227.pdf (Any fulltext), 2MB
 
File Permalink:
-
Name:
JAdhesion_58_1996_227.pdf
Description:
-
OA-Status:
Visibility:
Restricted (Max Planck Institute for Medical Research, MHMF; )
MIME-Type / Checksum:
application/pdf
Technical Metadata:
Copyright Date:
-
Copyright Info:
-
License:
-

Creators

show
hide
 Creators:
Buck, M., Author
Dressler, Ch., Author
Grunze, M.1, Author           
Träger, F., Author
Affiliations:
1Cellular Biophysics, Max Planck Institute for Medical Research, Max Planck Society, ou_2364731              

Content

show
hide
Free keywords: Film growth, polymer films, polymer-metal interfaces, polyamic acid, in situ monitoring, second harmonic generation
 Abstract: Optical second harmonic generation (SHG) was applied to monitor the growth of films of polyamic acid on polycrystalline gold substrates. Different diamines such as 4,4′-oxydianiline (ODA), 4,4′-diaminodiphenyl disulfide (DAPS) and 4,4′-diaminobiphenyl (benzidine) were codeposited from the gas phase with pyromel-litic dianhydride (PMDA). Depending on the diamine, the second harmonic signal varies differently during formation of the polymer/metal interface and the subsequent film growth. A three-layer model which takes into account the optical properties of thin films reveals that the shape of the thickness-dependent SH signal is related to the orientation of the molecules in the film. A fit of the experimental data based on the model indicates a structural transition that occurs several tens of nanometers above the substrate for PMDA/ODA and PMDA/DAPS. The experiments demonstrate that SHG can be applied to monitor the growth of thin films and to extract structural information.

Details

show
hide
Language(s): eng - English
 Dates: 1995-10-051995-06-031995-10-052006-09-241996
 Publication Status: Issued
 Pages: 15
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1080/00218469608015202
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Journal of Adhesion
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: London : Gordon and Breach
Pages: - Volume / Issue: 58 (3-4) Sequence Number: - Start / End Page: 227 - 241 Identifier: ISSN: 0021-8464
CoNE: https://pure.mpg.de/cone/journals/resource/954925409798