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  In situ X-ray diffraction studies on the piezoelectric response of PZT thin films

Davydok, A., Cornelius, T. W., Mocuta, C., Lima, E. C., Araújo, E. B., & Thomas, O. (2016). In situ X-ray diffraction studies on the piezoelectric response of PZT thin films. Thin Solid Films, 603, 29-33. doi:10.1016/j.tsf.2016.01.045.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-B868-B Version Permalink: http://hdl.handle.net/21.11116/0000-0001-B86D-6
Genre: Journal Article

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 Creators:
Davydok, Anton1, 2, Author              
Cornelius, Thomas Walter2, Author              
Mocuta, Cristian3, Author              
Lima, E. C.4, Author              
Araújo, Eudes B.5, Author              
Thomas, Olivier6, Author              
Affiliations:
1Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401              
2Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, Marseille, France, persistent22              
3Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin, Gif-sur-Yvette cedex, France, ou_persistent22              
4Universidade Federal do Tocantins, Porto Nacional, TO, Brazil, persistent22              
5Departamento de Fisica e Quimica, Universidade Estadual Paulista, Av. Brasil, 56 Centro, Ilha Solteira, SP, Brazil, persistent22              
6Aix-Marseille Université, IM2NP, Campus de Saint-Jérôme, Marseille, France, ou_persistent22              

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Free keywords: Anisotropy; Piezoelectricity; X ray diffraction, In-situ experiments; In-situ synchrotrons; In-situ X-ray diffraction; Piezo-effect; Piezoelectric anisotropy; Piezoelectric coefficient; Piezoelectric property; Piezoelectric response, Thin films
 Abstract: Piezoelectric properties of randomly oriented self-polarized PbZr0.50Ti0.50O3 (PZT) thin films were investigated using in situ synchrotron X-ray diffraction. Possibilities for investigating the piezoelectric effect using micro-sized hard X-ray beams are demonstrated and perspectives for future dynamical measurements on PZT samples with variety of compositions and thicknesses are given. Studies performed on the crystalline [100, 110] directions evidenced piezoelectric anisotropy. The piezoelectric coefficient d33 was calculated in terms of the lab reference frame (dperp) and found to be two times larger along the [100] direction than along the [110] direction. The absolute values for the dperp amount to 120 and 230 pm/V being in good agreement with experimental and theoretical values found in literature for bulk PZT ceramics. © 2016 Elsevier B.V. All rights reserved.

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Language(s): eng - English
 Dates: 2016-03-31
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1016/j.tsf.2016.01.045
BibTex Citekey: Davydok201629
 Degree: -

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Title: Thin Solid Films
  Abbreviation : Thin Solid Films
Source Genre: Journal
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Publ. Info: Lausanne, Switzerland, etc. : Elsevier
Pages: - Volume / Issue: 603 Sequence Number: - Start / End Page: 29 - 33 Identifier: ISSN: 0040-6090
CoNE: /journals/resource/954925449792