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  Ab initio calculations and experimental study of piezoelectric YxIn1-xN thin films deposited using reactive magnetron sputter epitaxy

Tholander, C., Birch, J., Tasnádi, F., Hultman, L., Palisaitis, J., Persson, P. O. Å., et al. (2016). Ab initio calculations and experimental study of piezoelectric YxIn1-xN thin films deposited using reactive magnetron sputter epitaxy. Acta Materialia, 105, 199-206. doi:10.1016/j.actamat.2015.11.050.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-B7BD-C Version Permalink: http://hdl.handle.net/21.11116/0000-0001-B7BE-B
Genre: Journal Article

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 Creators:
Tholander, Christopher1, Author              
Birch, Jens2, Author              
Tasnádi, Ferenc3, Author              
Hultman, Lars2, Author              
Palisaitis, Justinas4, Author              
Persson, Per Ola Åke4, Author              
Jensen, Jens A. D.4, Author              
Sandström, Per A.5, Author              
Alling, Björn2, 6, Author              
Žukauskaitė, Agnė5, 7, Author              
Affiliations:
1Department of Physics, Chemistry and Biology (IFM), Linköping University, Linköping, Sweden, ou_persistent22              
2Department of Physics, Chemistry and Biology (IFM), Thin Film Physics Division, Linköping University, Linköping, Sweden, ou_persistent22              
3Department of Physics, Chemistry and Biology, Linköping University Linköping, Sweden, ou_persistent22              
4Thin Film Physics Division, Department of Physics, Chemistry, and Biology (IFM), Linköping University, Linköping, Sweden, persistent22              
5Thin Film Physics Division, Department of Physics, Chemistry and Biology (IFM), Linköping University, Linköping, Sweden, persistent22              
6Adaptive Structural Materials (Simulation), Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863339              
7Fraunhofer Institute for Applied Solid State Physics IAF, Tullastrasse 72, Freiburg, Germany, persistent22              

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Free keywords: Aluminum nitride; Calculations; Crystallography; Deposition; Epitaxial growth; Isomers; Piezoelectricity; Scanning probe microscopy; Sputter deposition; Zinc sulfide, Ab initio calculations; Experimental verification; Magnetron sputter epitaxy; Piezoelectric property; Piezoelectric response; Piezoresponse force microscopy; Theoretical calculations; YInN, Thin films
 Abstract: By combining theoretical prediction and experimental verification we investigate the piezoelectric properties of yttrium indium nitride (YxIn1-xN). Ab initio calculations show that the YxIn1-xN wurtzite phase is lowest in energy among relevant alloy structures for 0≤x≤0.5. Reactive magnetron sputter epitaxy was used to prepare thin films with Y content up to x=0.51. The composition dependence of the lattice parameters observed in the grown films is in agreement with that predicted by the theoretical calculations confirming the possibility to synthesize a wurtzite solid solution. An AlN buffer layer greatly improves the crystalline quality and surface morphology of subsequently grown YxIn1-xN films. The piezoelectric response in films with x=0.09 and x=0.14 is observed using piezoresponse force microscopy. Theoretical calculations of the piezoelectric properties predict YxIn1-xN to have comparable piezoelectric properties to ScxAl1-xN. © 2015 Acta Materialia Inc.

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Language(s): eng - English
 Dates: 2016-02-15
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1016/j.actamat.2015.11.050
BibTex Citekey: Tholander2016199
 Degree: -

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Title: Acta Materialia
  Abbreviation : Acta Mater.
Source Genre: Journal
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Publ. Info: Kidlington : Elsevier Science
Pages: - Volume / Issue: 105 Sequence Number: - Start / End Page: 199 - 206 Identifier: ISSN: 1359-6454
CoNE: /journals/resource/954928603100