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  Magnetic microstructure in a stress-annealed Fe73.5Si15.5B7Nb3Cu1 soft magnetic alloy observed using off-axis electron holography and Lorentz microscopy

Kovács, A., Pradeep, K. G., Herzer, G., Raabe, D., & Dunin-Borkowski, R. E. (2016). Magnetic microstructure in a stress-annealed Fe73.5Si15.5B7Nb3Cu1 soft magnetic alloy observed using off-axis electron holography and Lorentz microscopy. AIP Advances, 6(5): 056501. doi:10.1063/1.4942954.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-BA29-0 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-BA2A-F
Genre: Journal Article

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Kovács, A.1, Author              
Pradeep, Konda Gokuldoss2, 3, Author              
Herzer, G.4, Author              
Raabe, Dierk3, Author              
Dunin-Borkowski, Rafal E.1, Author              
Affiliations:
1Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute 5, Forschungszentrum Jülich, 52425 Jülich, Germany, ou_persistent22              
2Materials Chemistry, RWTH Aachen University, Kopernikusstr.10, 52074 Aachen, Germany, ou_persistent22              
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
4Vacuumschmelze GmbH & Co KG, Grüner Weg 37, D-63450 Hanau, Germany, ou_persistent22              

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Free keywords: Annealing; Copper alloys; Electron holography; High resolution transmission electron microscopy; Holography; Ion beams; Magnetic materials; Magnetism; Microstructure; Saturation magnetization; Silicon; Transmission electron microscopy, Fe-Si-B-Nb-Cu alloys; High-frequency applications; High-saturation magnetization; Lorentz microscopies; Lorentz transmission electron microscopy; Magnetic domain patterns; Magnetic microstructures; Off-axis electron holography, Magnetic domains
 Abstract: Fe-Si-B-Nb-Cu alloys are attractive for high frequency applications due to their low coercivity and high saturation magnetization. Here, we study the effect of stress annealing on magnetic microstructure in Fe73.5Si15.5B7Nb3Cu1 using off-axis electron holography and the Fresnel mode of Lorentz transmission electron microscopy. A stress of 50 MPa was applied to selected samples during rapid annealing for 4 s, resulting in uniaxial anisotropy perpendicular to the stress direction. The examination of focused ion beam milled lamellae prepared from each sample revealed a random magnetic domain pattern in the sample that had been rapidly annealed in the absence of stress, whereas a highly regular domain pattern was observed in the stress-annealed sample. We also measured a decrease in domain wall width from ∼ 94 nm in the sample annealed without stress to ∼ 80 nm in the stress-annealed sample. © 2016 Author(s).

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Language(s): eng - English
 Dates: 2016
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1063/1.4942954
BibTex Citekey: Kovács2016
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Title: AIP Advances
Source Genre: Journal
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Pages: - Volume / Issue: 6 (5) Sequence Number: 056501 Start / End Page: - Identifier: ISSN: 2158-3226
CoNE: /journals/resource/21583226