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  Mining information from atom probe data

Cairney, J. M., Rajan, K. K., Haley, D., Gault, B., Bagot, P. A. J., Choi, P.-P., et al. (2015). Mining information from atom probe data. Ultramicroscopy, 159, 324-337. doi:10.1016/j.ultramic.2015.05.006.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-BAA2-6 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-BAA6-2
Genre: Journal Article

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 Creators:
Cairney, Julie M.1, 2, Author              
Rajan, Kumaresh K.3, Author              
Haley, Daniel4, 5, Author              
Gault, Baptiste6, Author              
Bagot, Paul Alexander J.7, Author              
Choi, Pyuck-Pa8, Author              
Felfer, Peter J.9, 10, Author              
Ringer, Simon P.11, 12, Author              
Marceau, Ross K. W.13, Author              
Moody, Michael P.14, Author              
Affiliations:
1School of Aerospace Mechanical and Mechatronic Engineering, The University of Sydney, NSW 2006, Australia, ou_persistent22              
2Australian Centre for Microscopy and Microanalysis, The University of Sydney, NSW 2006, Australia, ou_persistent22              
3Department of Materials Science and Engineering, Iowa State University, Ames, IA, USA, persistent22              
4University of Oxford, Department of Materials, Parks RoadOxford, UK, ou_persistent22              
5Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
6Department of Materials, University of Oxford, Parks Road, Oxford, UK, ou_persistent22              
7Department of Materials, University of Oxford, Oxford, UK, ou_persistent22              
8Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
9AMME and Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, New South Wales 2006, Australia, persistent22              
10School of Aerospace, Mechanical, Mechatronic Engineering, The University of Sydney, NSW, Australia, persistent22              
11School of Aerospace, Mechanical and Mechatronic Engineering, University of Sydney, NSW, Australia, ou_persistent22              
12Australian Centre for Microscopy and Microanalysis, School of Aerospace, Mechatronic and Mechanical Engineering, University of Sydney, NSW 2006, Australia, ou_persistent22              
13Deakin University, Institute for Frontier Materials, Geelong Waurn Ponds CampusVIC, Australia, ou_persistent22              
14Department of Materials, University of Oxford, Parks Road, Oxford OX13PH, UK, ou_persistent22              

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Free keywords: Atoms; Crystallography; Image reconstruction; Materials handling; Microscopic examination; Probes, Analytical tool; Atom probe tomography; Chemical correlation; Clustering; Data challenges; Large amounts of data; Short range ordering; Single specimen, Data mining, analytic method; Article; atom probe tomography; correlation analysis; crystallography; data mining; image reconstruction; information processing; microscopy; quantitative analysis; sensitivity analysis; tomography
 Abstract: Whilst atom probe tomography (APT) is a powerful technique with the capacity to gather information containing hundreds of millions of atoms from a single specimen, the ability to effectively use this information creates significant challenges. The main technological bottleneck lies in handling the extremely large amounts of data on spatial-chemical correlations, as well as developing new quantitative computational foundations for image reconstruction that target critical and transformative problems in materials science. The power to explore materials at the atomic scale with the extraordinary level of sensitivity of detection offered by atom probe tomography has not been not fully harnessed due to the challenges of dealing with missing, sparse and often noisy data. Hence there is a profound need to couple the analytical tools to deal with the data challenges with the experimental issues associated with this instrument. In this paper we provide a summary of some key issues associated with the challenges, and solutions to extract or "mine" fundamental materials science information from that data. © 2015.

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Language(s): eng - English
 Dates: 2015-12-01
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1016/j.ultramic.2015.05.006
BibTex Citekey: Cairney2015324
 Degree: -

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Title: Ultramicroscopy
  Abbreviation : Ultramicroscopy
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Amsterdam : North-Holland
Pages: - Volume / Issue: 159 Sequence Number: - Start / End Page: 324 - 337 Identifier: ISSN: 0304-3991
CoNE: /journals/resource/954925512451