English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Biaxial machine at Diffabs beamline for studying mechanical properties of thin films deposited onto polymer substrates [Machine biaxiale sur la ligne de lumiere Diffabs pour l'etude des proprietes mecaniques de films minces deposes sur substrats polymeres]

Faurie, D., Djaziri, S., Renault, P. O., Le Bourhis, É., Goudeau, P. H., Geandier, G., et al. (2015). Biaxial machine at Diffabs beamline for studying mechanical properties of thin films deposited onto polymer substrates [Machine biaxiale sur la ligne de lumiere Diffabs pour l'etude des proprietes mecaniques de films minces deposes sur substrats polymeres]. Materiaux et Techniques, 103(6): 610. doi:10.1051/mattech/2015057.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/21.11116/0000-0001-BF73-7 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-BF74-6
Genre: Journal Article

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Faurie, Damien1, Author              
Djaziri, Soundès2, 3, Author              
Renault, Pierre Olivier4, Author              
Le Bourhis, Éric4, Author              
Goudeau, Philippe H.4, Author              
Geandier, Guillaume5, Author              
Thiaudière, Dominique6, Author              
Affiliations:
1LSPM, (UPR 3407 CNRS), Université Paris 13, Institut Galilée, 99 avenue Jean-Baptiste Clément, Villetaneuse, France, ou_persistent22              
2Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
3Institut Pprime, Universite de Poitiers, Futuroscope Cedex, France, persistent22              
4Institut p' (UPR 3346 CNRS), Université de Poitiers, Bd Pierre et Marie Curie, Futuroscope cedex, France, ou_persistent22              
5Institut Jean Lamour (UMR 3079 CNRS), Université de Lorraine, Parc de Saurupt, CS 50840, Nancy Cedex, France, ou_persistent22              
6Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin, Gif-sur-Yvette cedex, France, ou_persistent22              

Content

show
hide
Free keywords: Mechanical testing; Polymer films; Polymers; Synchrotrons; X ray diffraction, Beam lines; Biaxial tests; Deformation mechanism; Digital image correlations; Flexible substrate; Mechanical behavior; Nanoscale thickness; Polymer substrate, Thin films
 Abstract: This article illustrates the implementation of biaxial tests of thin films of nanoscale thickness on flexible substrates (polymers). Biaxial machine has been developed for this purpose and is located within the DIFFABS beamline at Soleil synchrotron. This is combined with techniques for measuring strain, as the X-ray diffraction and the Digital Image Correlation. We show that this ensemble can probe the mechanical behavior of thin films, from elasticity to fissuration, with extra clues to the deformation mechanisms. © 2015 EDP Sciences.

Details

show
hide
Language(s): fra - French
 Dates: 2015
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1051/mattech/2015057
BibTex Citekey: Faurie2015
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Materiaux et Techniques
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: France : EDP Sciences
Pages: - Volume / Issue: 103 (6) Sequence Number: 610 Start / End Page: - Identifier: ISSN: 00326895
CoNE: /journals/resource/00326895