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  Characterization of X-ray induced damage in alkanethiolate monolayers by high-resolution photoelectron spectroscopy

Heister, K., Zharnikov, M., Grunze, M., Johansson, L. S. O., & Ulman, A. (2001). Characterization of X-ray induced damage in alkanethiolate monolayers by high-resolution photoelectron spectroscopy. Langmuir, 17(1), 8-11. doi:10.1021/la001101d.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-BD89-0 Version Permalink: https://hdl.handle.net/21.11116/0000-000A-1257-0
Genre: Journal Article

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Langmuir_17_2001_8.pdf (Any fulltext), 77KB
 
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 Creators:
Heister, K., Author
Zharnikov, M., Author
Grunze, M.1, Author           
Johansson, L. S. O., Author
Ulman, A., Author
Affiliations:
1Cellular Biophysics, Max Planck Institute for Medical Research, Max Planck Society, ou_2364731              

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 Abstract: Synchrotron-based high-resolution X-ray photoelectron spectroscopy was for the first time applied to investigate the damage in self-assembled monolayers (SAMs) of alkanethiols (AT) on Au caused by soft X-rays. The observed changes in AT SAMs and, in particular, the appearance of a new, irradiation-induced sulfur species are identical to those caused by electron bombardment, implying that most of the damage is produced by the photoelectrons and secondary electrons. The irradiation-induced sulfur species is identified as a dialkyl sulfide distributed within the AT film. Only minutes of monochromatized X-ray irradiation at an undulator beamline destroys the AT adlayer completely.

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Language(s): eng - English
 Dates: 2000-10-232000-07-312000-12-092001
 Publication Status: Issued
 Pages: 4
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 Rev. Type: Peer
 Identifiers: DOI: 10.1021/la001101d
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Title: Langmuir
Source Genre: Journal
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Publ. Info: Columbus, OH : American Chemical Society
Pages: - Volume / Issue: 17 (1) Sequence Number: - Start / End Page: 8 - 11 Identifier: ISSN: 0743-7463
CoNE: https://pure.mpg.de/cone/journals/resource/954925541194