English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se2 and CuInS2 in thin film solar cells

Schwarz, T., Stechmann, G., Gault, B., Cojocaru-Mirédin, O., Würz, R., Lomuscio, A., et al. (2018). Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se2 and CuInS2 in thin film solar cells. Talk presented at APT&M 2018, NIST. Gaithersburg, MD, USA. 2018-06-10 - 2018-06-15.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Schwarz, Torsten1, Author           
Stechmann, Guillaume2, Author           
Gault, Baptiste1, Author           
Cojocaru-Mirédin, Oana3, 4, Author           
Würz, Roland5, Author           
Lomuscio, Alberto6, Author           
Siebentritt, Susanne7, Author           
Raabe, Dierk2, Author           
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
3Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863387              
4I. Physikalisches Institut (IA), RWTH Aachen, 52074 Aachen, Germany, persistent22              
5Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden Württemberg, Industriestraße 6, 70565 Stuttgart, Germany, ou_persistent22              
6Laboratory for Photovoltaics, University of Luxembourg, Belvaux, Luxembourg, persistent22              
7University of Luxembourg, Laboratory for Photovoltaics, 41, rue du Brill, L-4422, Belvaux, Luxembourg, ou_persistent22              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2018-06
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

show
hide
Title: APT&M 2018, NIST
Place of Event: Gaithersburg, MD, USA
Start-/End Date: 2018-06-10 - 2018-06-15

Legal Case

show

Project information

show

Source

show