Correlative transmission Kikuchi diffraction and atom probe tomography analysis 
of grain boundaries in Cu(In,Ga) Se2 and CuInS2 in thin film solar cells

Schwarz, Torsten; Stechmann, Guillaume; Gault, Baptiste; Cojocaru-Mirédin, Oana; Würz, Roland; Lomuscio, Alberto; Siebentritt, Susanne; Raabe, Dierk

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Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se₂ and CuInS₂ in thin film solar cells

Schwarz, T., Stechmann, G., Gault, B., Cojocaru-Mirédin, O., Würz, R., Lomuscio, A., et al. (2018). Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se₂ and CuInS₂ in thin film solar cells. Talk presented at APT&M 2018, NIST. Gaithersburg, MD, USA. 2018-06-10 - 2018-06-15.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-D5ED-4 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-D5EE-3

Genre: Talk

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Creators:
Schwarz, Torsten¹, Author
Stechmann, Guillaume², Author
Gault, Baptiste¹, Author
Cojocaru-Mirédin, Oana^{3, 4}, Author
Würz, Roland⁵, Author
Lomuscio, Alberto⁶, Author
Siebentritt, Susanne⁷, Author
Raabe, Dierk², Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
3Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863387
4I. Physikalisches Institut (IA), RWTH Aachen, 52074 Aachen, Germany, persistent22
5Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden Württemberg, Industriestraße 6, 70565 Stuttgart, Germany, ou_persistent22
6Laboratory for Photovoltaics, University of Luxembourg, Belvaux, Luxembourg, persistent22
7University of Luxembourg, Laboratory for Photovoltaics, 41, rue du Brill, L-4422, Belvaux, Luxembourg, ou_persistent22

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Language(s): eng - English

Dates: Created: 2018-06

Publication Status: Not specified

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Title: APT&M 2018, NIST

Place of Event: Gaithersburg, MD, USA

Start-/End Date: 2018-06-10 - 2018-06-15

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