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  Increased detector efficiency helps to reveal new insights into compositional fluctuations at defects in Cu2ZnSnSe4 thin films

Schwarz, T., Redinger, A., Siebentritt, S., Gault, B., Raabe, D., & Choi, P.-P. (2018). Increased detector efficiency helps to reveal new insights into compositional fluctuations at defects in Cu2ZnSnSe4 thin films. Poster presented at APT&M 2018, NIST, Gaithersburg, MD, USA.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-D5E3-E Version Permalink: http://hdl.handle.net/21.11116/0000-0001-D5E4-D
Genre: Poster

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 Creators:
Schwarz, Torsten1, Author              
Redinger, Alex2, Author              
Siebentritt, Susanne2, Author              
Gault, Baptiste1, Author              
Raabe, Dierk3, Author              
Choi, Pyuck-Pa4, Author              
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2University of Luxembourg, Laboratory for Photovoltaics, 41, rue du Brill, L-4422, Belvaux, Luxembourg, ou_persistent22              
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
4Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea, ou_persistent22              

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Language(s): eng - English
 Dates: 2018
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: APT&M 2018, NIST
Place of Event: Gaithersburg, MD, USA
Start-/End Date: 2018-06-10 - 2018-06-15

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