Supervision on multi-dimensional data from electron microscopy

Zhang, Siyuan; Scheu, Christina

Lokale TagsFreigabegeschichteDetailsÜbersicht

Supervision on multi-dimensional data from electron microscopy

Zhang, S., & Scheu, C. (2018). Supervision on multi-dimensional data from electron microscopy. Poster presented at BiGmaxWorkshop 2018 on Big-Data-DrivenMaterials Science, Irsee, Germany.

Item is Freigegeben

einblenden: alle ausblenden: alle

Basisdaten

einblenden: ausblenden:

Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0001-D809-2 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0001-D80A-1

Genre: Poster

ausblenden:

Urheber:
Zhang, Siyuan¹, Autor
Scheu, Christina¹, Autor

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294