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  Huygens STED deconvolution increases signal-to-noise and image resolution towards 22 nm.

Schoonderwoert, V., Dijkstra, R., Lukinavicius, G., & Kobler, O. (2013). Huygens STED deconvolution increases signal-to-noise and image resolution towards 22 nm. Microscopy Today, 21(6), 38-44. doi:10.1017/S1551929513001089.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-E46E-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-E470-F
Genre: Journal Article

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Schoonderwoert, V., Author
Dijkstra, R., Author
Lukinavicius, G.1, Author              
Kobler, O., Author
Affiliations:
1Laboratory of Chromatin Labeling and Imaging, Max Planck Institute for Biophysical Chemistry, Max Planck Society, ou_2616691              

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Language(s): eng - English
 Dates: 2013-11-052013-11
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1017/S1551929513001089
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Title: Microscopy Today
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 21 (6) Sequence Number: - Start / End Page: 38 - 44 Identifier: -