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  On the detection of multiple events in atom probe tomography

Peng, Z., Vurpillot, F., Choi, P.-P., Li, Y., Raabe, D., & Gault, B. (2018). On the detection of multiple events in atom probe tomography. Ultramicroscopy, 189, 54-60. doi:10.1016/j.ultramic.2018.03.018.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-E74F-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0004-6EF1-1
Genre: Journal Article

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 Creators:
Peng, Zirong1, Author              
Vurpillot, François2, Author              
Choi, Pyuck-Pa3, 4, Author              
Li, Yujiao5, Author              
Raabe, Dierk1, Author              
Gault, Baptiste3, Author              
Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
2GPM UMR 6634 CNRS, Université et INSA de Rouen, Rouen, France, ou_persistent22              
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
4Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea, ou_persistent22              
5Center for Interface-Dominated High Performance Materials, Ruhr-Universität Bochum, Bochum 44780, Germany, ou_persistent22              

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Free keywords: Atoms; Tungsten carbide, Atom probe tomography; Dead time; Dead zones; Delay-line detectors; Multiple events, Probes, tungsten; tungsten carbide; unclassified drug, Article; atom probe microscope; atom probe tomography; chemical reaction; molecular ion dissociation; signal transduction; time of flight mass spectrometry; tomography
 Abstract: In atom probe tomography (APT), multiple events can arise as a consequence of e.g. correlated field evaporation and molecular ion dissociation. They represent challenging cases for single-particle detectors and can cause compositional as well as spatial inaccuracies. Here, two state-of-the-art atom probe microscopes (Cameca LEAP 5000 XS and 5000 XR) were used to investigate cemented tungsten carbide, which exhibits high amounts of multiple events. By advanced data analysis methods, the natural character of the multiple events, as well as the performance of the APT detectors, are assessed. Accordingly, possible signal loss mechanisms are discussed. © 2018 Elsevier B.V.

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Language(s): eng - English
 Dates: 2018-06
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1016/j.ultramic.2018.03.018
 Degree: -

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Title: Ultramicroscopy
  Abbreviation : Ultramicroscopy
Source Genre: Journal
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Publ. Info: Amsterdam : North-Holland
Pages: - Volume / Issue: 189 Sequence Number: - Start / End Page: 54 - 60 Identifier: ISSN: 0304-3991
CoNE: /journals/resource/954925512451