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Free keywords:
Atoms; Tungsten carbide, Atom probe tomography; Dead time; Dead zones; Delay-line detectors; Multiple events, Probes, tungsten; tungsten carbide; unclassified drug, Article; atom probe microscope; atom probe tomography; chemical reaction; molecular ion dissociation; signal transduction; time of flight mass spectrometry; tomography
Abstract:
In atom probe tomography (APT), multiple events can arise as a consequence of e.g. correlated field evaporation and molecular ion dissociation. They represent challenging cases for single-particle detectors and can cause compositional as well as spatial inaccuracies. Here, two state-of-the-art atom probe microscopes (Cameca LEAP 5000 XS and 5000 XR) were used to investigate cemented tungsten carbide, which exhibits high amounts of multiple events. By advanced data analysis methods, the natural character of the multiple events, as well as the performance of the APT detectors, are assessed. Accordingly, possible signal loss mechanisms are discussed. © 2018 Elsevier B.V.
