Use of micro-beam PIXE and NRA in postmortem analysis of samples exposed in 
plasma devices

Kelemen, M.; Zaloznik, A.; Pecovnik, M.; Vavpetic, P.; Pelicon, P.; Hakola, An.; Laan, M.; Kapser, S.; Markelj, S.

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Use of micro-beam PIXE and NRA in postmortem analysis of samples exposed in plasma devices

Kelemen, M., Zaloznik, A., Pecovnik, M., Vavpetic, P., Pelicon, P., Hakola, A., et al. (2018). Use of micro-beam PIXE and NRA in postmortem analysis of samples exposed in plasma devices. Poster presented at European Conference on X-Ray Spectrometry, Ljubljana.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0001-E7F2-9 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0001-E7F3-8

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Urheber:
Kelemen, M.¹, Autor
Zaloznik, A.¹, Autor
Pecovnik, M.¹, Autor
Vavpetic, P.¹, Autor
Pelicon, P.¹, Autor
Hakola, An.¹, Autor
Laan, M.¹, Autor
Kapser, S.², Autor
Markelj, S.¹, Autor

Affiliations:
1External Organizations, ou_persistent22
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327