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  In situ full-field measurement of surface oxidation on Ni-based alloy using high temperature scanning probe microscopy

Li, Y., Fang, X., Qu, Z., Lu, S.-Y., Li, H., Zhu, T., et al. (2018). In situ full-field measurement of surface oxidation on Ni-based alloy using high temperature scanning probe microscopy. Scientific Reports, 8: 6684, pp. 1-9. doi:10.1038/s41598-018-24656-w.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-F6B2-0 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-F6B3-F
Genre: Journal Article

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 Creators:
Li, Yan1, 2, Author              
Fang, Xufei3, Author              
Qu, Zhe4, Author              
Lu, Si-Yuan1, 5, Author              
Li, Haicheng4, 6, Author              
Zhu, Ting7, Author              
Yu, Qingmin8, Author              
Feng, Xue1, 5, Author              
Affiliations:
1AML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084, China, persistent22              
2Center for Mechanics and Materials, Tsinghua University, Beijing 100084, China, persistent22              
3Nanotribology, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863402              
4AML, Department of Engineering Mechanics, Tsinghua University, Beijing, 100084, China, persistent22              
5Center for Advanced Mechanics and Materials, Tsinghua University, Beijing, China, persistent22              
6Center for Advanced Mechanics and Materials, Tsinghua University, Beijing, 100084, China, persistent22              
7Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA, persistent22              
8School of Mechanics, Civil Engineering and Architecture, Northwestern Polytechnical University, Xi’an, 710072, China, persistent22              

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Language(s): eng - English
 Dates: 2018-04-272018-04-27
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1038/s41598-018-24656-w
 Degree: -

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Title: Scientific Reports
  Abbreviation : Sci. Rep.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: 9 Volume / Issue: 8 Sequence Number: 6684 Start / End Page: 1 - 9 Identifier: ISSN: 2045-2322
CoNE: https://pure.mpg.de/cone/journals/resource/2045-2322