In situ full-field measurement of surface oxidation on Ni-based alloy using 
high temperature scanning probe microscopy

Li, Yan; Fang, Xufei; Qu, Zhe; Lu, Si-Yuan; Li, Haicheng; Zhu, Ting; Yu, Qingmin; Feng, Xue

doi:10.1038/s41598-018-24656-w

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In situ full-field measurement of surface oxidation on Ni-based alloy using high temperature scanning probe microscopy

Li, Y., Fang, X., Qu, Z., Lu, S.-Y., Li, H., Zhu, T., et al. (2018). In situ full-field measurement of surface oxidation on Ni-based alloy using high temperature scanning probe microscopy. Scientific Reports, 8: 6684, pp. 1-9. doi:10.1038/s41598-018-24656-w.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-F6B2-0 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-F6B3-F

Genre: Journal Article

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Creators:
Li, Yan^{1, 2}, Author
Fang, Xufei³, Author
Qu, Zhe⁴, Author
Lu, Si-Yuan^{1, 5}, Author
Li, Haicheng^{4, 6}, Author
Zhu, Ting⁷, Author
Yu, Qingmin⁸, Author
Feng, Xue^{1, 5}, Author

Affiliations:
1AML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084, China, persistent22
2Center for Mechanics and Materials, Tsinghua University, Beijing 100084, China, persistent22
3Nanotribology, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863402
4AML, Department of Engineering Mechanics, Tsinghua University, Beijing, 100084, China, persistent22
5Center for Advanced Mechanics and Materials, Tsinghua University, Beijing, China, persistent22
6Center for Advanced Mechanics and Materials, Tsinghua University, Beijing, 100084, China, persistent22
7Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA, persistent22
8School of Mechanics, Civil Engineering and Architecture, Northwestern Polytechnical University, Xi’an, 710072, China, persistent22

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Language(s): eng - English

Dates: Published Online: 2018-04-27Date issued: 2018-04-27

Publication Status: Issued

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Rev. Type: Peer

Identifiers: DOI: 10.1038/s41598-018-24656-w

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Title: Scientific Reports

Abbreviation : Sci. Rep.

Source Genre: Journal

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Pages: 9 Volume / Issue: 8 Sequence Number: 6684 Start / End Page: 1 - 9 Identifier: ISSN: 2045-2322
CoNE: https://pure.mpg.de/cone/journals/resource/2045-2322