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  In-situ observation of irregular void growth in Al thin films during solid state dewetting

Hieke, S. W., Willinger, M. G., Wang, Z.-J., Richter, G., Chatain, D., Dehm, G., et al. (2018). In-situ observation of irregular void growth in Al thin films during solid state dewetting. Poster presented at 19th International Microscopy Congress (IMC19), Sydney, Australia.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0002-01E1-E Version Permalink: http://hdl.handle.net/21.11116/0000-0002-01E2-D
Genre: Poster

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 Creators:
Hieke, Stefan Werner1, Author              
Willinger, Marc Georg2, 3, Author              
Wang, Zhu-Jun2, Author              
Richter, Gunther4, Author              
Chatain, Dominique5, Author              
Dehm, Gerhard6, Author              
Scheu, Christina1, 7, Author              
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
3Marc Willinger, Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_2364728              
4Central Scientific Facility Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              
5Aix-Marseille Univ., CNRS, CINAM, Marseille, France, persistent22              
6Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              
7Materials Analytics, RWTH Aachen University, Kopernikusstrasse 10, Aachen, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2018-09
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: 19th International Microscopy Congress (IMC19)
Place of Event: Sydney, Australia
Start-/End Date: 2018-09-09 - 2018-09-14

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