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  In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire

Hieke, S. W., Willinger, M. G., Wang, Z.-J., Richter, G., Dehm, G., & Scheu, C. (2017). In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. Talk presented at 13th Multinational Congress on Microscopy. Rovinj, Croatia. 2017-09-26 - 2017-09-29.

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 Creators:
Hieke, Stefan Werner1, Author           
Willinger, Marc Georg2, Author           
Wang, Zhu-Jun2, Author           
Richter, Gunther3, Author           
Dehm, Gerhard4, Author           
Scheu, Christina1, Author           
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
3Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2017-09
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: 13th Multinational Congress on Microscopy
Place of Event: Rovinj, Croatia
Start-/End Date: 2017-09-26 - 2017-09-29
Invited: Yes

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