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  Evolution of faceted voids and fingering instabilities in a model thin film system - Insights by in-situ environmental scanning electron microscopy

Hieke, S. W., Willinger, M. G., Wang, Z.-J., Richter, G., Dehm, G., & Scheu, C. (2017). Evolution of faceted voids and fingering instabilities in a model thin film system - Insights by in-situ environmental scanning electron microscopy. Talk presented at Symposium - In situ Microscopy with Electrons, X‐rays and Scanning Probes, Universität Erlangen‐Nürnberg. Erlangen, Germany. 2017-10-09.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-FFD3-2 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-FFD4-1
Genre: Talk

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 Creators:
Hieke, Stefan Werner1, Author              
Willinger, Marc Georg2, Author              
Wang, Zhu-Jun2, Author              
Richter, Gunther3, Author              
Dehm, Gerhard4, Author              
Scheu, Christina1, 5, Author              
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
3Central Scientific Facility Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              
5Materials Analytics, RWTH Aachen University, Kopernikusstrasse 10, Aachen, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2017-10-09
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: Symposium - In situ Microscopy with Electrons, X‐rays and Scanning Probes, Universität Erlangen‐Nürnberg
Place of Event: Erlangen, Germany
Start-/End Date: 2017-10-09
Invited: Yes

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