High resolution scanning electron microscope for sequential testing and 
analyses of full-size PFC components of AUG

Balden, M.; Elgeti, S.; Neu, R.; Greuner, H.; Herrmann, A.; Krieger, K.; Rohde, V.; Zammuto, I.; ASDEX Upgrade Team, Max Planck Institute for Plasma Physics, Max Planck Society

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High resolution scanning electron microscope for sequential testing and analyses of full-size PFC components of AUG

Balden, M., Elgeti, S., Neu, R., Greuner, H., Herrmann, A., Krieger, K., et al. (2018). High resolution scanning electron microscope for sequential testing and analyses of full-size PFC components of AUG. Poster presented at 30th Symposium on Fusion Technology (SOFT 2018), Giardini Naxos.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0002-198F-2 Version Permalink: https://hdl.handle.net/21.11116/0000-0003-3812-A

Genre: Poster

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Creators:
Balden, M.¹, Author
Elgeti, S.¹, Author
Neu, R.^{1, 2}, Author
Greuner, H.¹, Author
Herrmann, A.³, Author
Krieger, K.¹, Author
Rohde, V.¹, Author
Zammuto, I.³, Author
ASDEX Upgrade Team, Max Planck Institute for Plasma Physics, Max Planck Society, Author

Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327
2External Organizations, ou_persistent22
3Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856321

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Language(s): eng - English

Dates: Submitted: 2018

Publication Status: Submitted

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Title: 30th Symposium on Fusion Technology (SOFT 2018)

Place of Event: Giardini Naxos

Start-/End Date: 2018-09-16 - 2018-09-21

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