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  X-ray spectroscopy with variable line spacing based on reflection zone plate optics

Yin, Z., Löchel, H., Rehanek, J., Goy, C., Kalinin, A., Schottelius, A., et al. (2018). X-ray spectroscopy with variable line spacing based on reflection zone plate optics. Optics Letters, 43(18), 4390-4393. doi:10.1364/OL.43.004390.

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 Creators:
Yin, Zhong1, 2, Author
Löchel, Heike3, Author
Rehanek, Jens4, 5, Author
Goy, Claudia6, Author
Kalinin, Anton6, 7, Author
Schottelius, Alexander6, Author
Trinter, Florian1, 6, 8, Author           
Miedema, Piter1, Author
Jain, Avni1, Author
Valerio, Joana1, Author
Busse, Philipp1, Author
Lehmkühler, Felix1, 9, Author
Möller, Johannes10, Author
Grübel, Gerhard1, 10, Author
Madsen, Anders10, Author
Viefhaus, Jens1, 11, Author
Grisenti, Robert E.6, 7, Author
Beye, Martin1, Author
Erko, Alexei12, Author
Techert, Simone1, 13, Author
Affiliations:
1Photon Science, Deutsches Elektronen-Synchrotron (DESY), Hamburg 22607, Germany, ou_persistent22              
2Laboratorium für Physikalische Chemie, ETH Zürich, Zürich 8093, Switzerland, ou_persistent22              
3Nano Optics Berlin GmbH, Berlin 12489, Germany, ou_persistent22              
4Paul Scherrer Institute, Villigen PSI 5232, Switzerland, ou_persistent22              
5Advanced Accelerator Technologies AG, Park InnovAARE, deliveryLAB,, Villigen 5234, Switzerland, ou_persistent22              
6Institut für Kernphysik, Johann Wolfgang Goethe-Universität Frankfurt, Frankfurt 60438, Germany, ou_persistent22              
7GSI Helmholtzzentrum für Schwerionenforschung, 64291 Darmstadt, Germany, ou_persistent22              
8Molecular Physics, Fritz Haber Institute, Max Planck Society, Berlin, DE, ou_634545              
9The Hamburg Centre for Ultrafast Imaging, Hamburg 22761, Germany, ou_persistent22              
10European X-Ray Free-Electron Laser Facility, Holzkoppel 4, Schenefeld 22869, Germany, ou_persistent22              
11Helmholtz Zentrum Berlin für Materialien und Energie GmbH, Berlin 12489, Germany, ou_persistent22              
12Institut für angewandte Photonik e. V., Berlin 12489, Germany, ou_persistent22              
13Institute for X-ray Physics, University of Göttingen, Göttingen 37077, Germany, ou_persistent22              

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 Abstract: X-ray spectroscopy is a method, ideally suited for investigating the electronic structure of matter, which has been enabled by the rapid developments in light sources and instruments. The X-ray fluorescence lines of life-relevant elements such as carbon, nitrogen, and oxygen are located in the soft X-ray regime and call for suitable spectrometer devices. In this work, we present a high resolution spectrum of liquid water, recorded with a soft X-ray spectrometer based on a reflection zone plate (RZP) design. The RZP-based spectrometer with meridional variation of line space density from 2953 l/mm to 3757 l/mm, offers extremely high detection efficiency and at the same time medium energy resolution. We can reproduce the well-known splitting of liquid water in the lone pair regime with 10 s acquisition time.

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Language(s): eng - English
 Dates: 2018-07-232018-08-092018-09-10
 Publication Status: Issued
 Pages: 4
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1364/OL.43.004390
 Degree: -

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Title: Optics Letters
Source Genre: Journal
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Publ. Info: Washington : Optical Society of America
Pages: - Volume / Issue: 43 (18) Sequence Number: - Start / End Page: 4390 - 4393 Identifier: ISSN: 0146-9592
CoNE: https://pure.mpg.de/cone/journals/resource/954925474435