In-situ wavelength calibration system for the X-ray Imaging Crystal 
Spectrometer (XICS) on W7-X

Kring, J. D.; Pablant, N. A.; Langenberg, A.; Rice, J. E.; Delgado-Aparicio, L. F.; Maurer, D. A.; Traverso, P. J.; Bitter, M. L.; Hill, K. W.; Reinke, M. L.

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In-situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X

Kring, J. D., Pablant, N. A., Langenberg, A., Rice, J. E., Delgado-Aparicio, L. F., Maurer, D. A., et al. (2018). In-situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X. Poster presented at 60th Annual Meeting of the APS Division of Plasma Physics, Portland, OR.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0002-7B8D-6 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-7B8E-5

Genre: Poster

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Creators:
Kring, J. D.¹, Author
Pablant, N. A.¹, Author
Langenberg, A.², Author
Rice, J. E.¹, Author
Delgado-Aparicio, L. F.¹, Author
Maurer, D. A.¹, Author
Traverso, P. J.¹, Author
Bitter, M. L.¹, Author
Hill, K. W.¹, Author
Reinke, M. L.¹, Author

Affiliations:
1External Organizations, ou_persistent22
2Stellarator Heating and Optimisation (E3), Max Planck Institute for Plasma Physics, Max Planck Society, ou_2040305

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Language(s): eng - English

Dates: Created: 2018

Publication Status: Not specified

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Title: 60th Annual Meeting of the APS Division of Plasma Physics

Place of Event: Portland, OR

Start-/End Date: 2018-11-05 - 2018-11-09

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