Degradation analysis of electrocatalyst using identical location STEM 
measurements

Scheu, Christina

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Degradation analysis of electrocatalyst using identical location STEM measurements

Scheu, C. (2018). Degradation analysis of electrocatalyst using identical location STEM measurements. Talk presented at 3rd Sino-German Symposium on Advanced Electron Microscopy of Interface Structures and Properties of Materials, Tsinghua University. Beijing, China. 2018-09-24 - 2018-09-27.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0002-861B-9 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-861C-8

Genre: Talk

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Creators:
Scheu, Christina¹, Author

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294

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Language(s): eng - English

Dates: Created: 2018-09

Publication Status: Not specified

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Title: 3rd Sino-German Symposium on Advanced Electron Microscopy of Interface Structures and Properties of Materials, Tsinghua University

Place of Event: Beijing, China

Start-/End Date: 2018-09-24 - 2018-09-27

Invited: Yes

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